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| GAL16V8/883 High Performance E2CMOS PLD Generic Array LogicTM Features * HIGH PERFORMANCE E2CMOS(R) TECHNOLOGY -- 7.5 ns Maximum Propagation Delay -- Fmax = 100 MHz -- 6 ns Maximum from Clock Input to Data Output -- TTL Compatible 12 mA Outputs -- UltraMOS(R) Advanced CMOS Technology * 50% REDUCTION IN POWER FROM BIPOLAR -- 75mA Typ Icc * ACTIVE PULL-UPS ON ALL PINS (GAL16V8D-7 and GAL16V8D-10) * E CELL TECHNOLOGY -- Reconfigurable Logic -- Reprogrammable Cells -- 100% Tested/100% Yields -- High Speed Electrical Erasure (<100ms) -- 20 Year Data Retention * EIGHT OUTPUT LOGIC MACROCELLS -- Maximum Flexibility for Complex Logic Designs -- Programmable Output Polarity -- Also Emulates 20-pin PAL(R) Devices with Full Function/ Fuse Map/Parametric Compatibility * PRELOAD AND POWER-ON RESET OF ALL REGISTERS -- 100% Functional Testability * APPLICATIONS INCLUDE: -- DMA Control -- State Machine Control -- High Speed Graphics Processing -- Standard Logic Speed Upgrade * ELECTRONIC SIGNATURE FOR IDENTIFICATION I 8 I OLMC OE Functional Block Diagram I/CLK CLK 8 I 8 I OLMC I/O/Q OLMC I/O/Q PROGRAMMABLE AND-ARRAY (64 X 32) 8 OLMC I/O/Q 2 I 8 OLMC I/O/Q I 8 OLMC I/O/Q I 8 OLMC I/O/Q I 8 OLMC I/O/Q I/O/Q I/OE Description The GAL16V8/883 is a high performance E2CMOS programmable logic device processed in full compliance to MIL-STD-883. This military grade device combines a high performance CMOS process with Electrically Erasable (E2) floating gate technology to provide the highest speed/power performance available in the 883 qualified PLD market. The GAL16V8D/883, at 7.5ns maximum propagation delay time, is the world's fastest military qualified CMOS PLD. The generic GAL architecture provides maximum design flexibility by allowing the Output Logic Macrocell (OLMC) to be configured by the user. The GAL16V8/883 is capable of emulating all standard 20-pin PAL(R) devices with full function/fuse map/parametric compatibility. Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. Therefore, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified. Pin Configuration CERDIP LCC I/CLK I I 3 I I I I I 8 9 I GND 11 I/OE I/O/Q 13 I/O/Q 6 4 I 2 I/CLK Vcc 20 I/O/Q 19 18 I/O/Q I/O/Q 1 20 Vcc I/O/Q I/O/Q I I I I I 5 GAL 16V8 15 I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q GAL16V8 Top View 16 I/O/Q I/O/Q 14 I/O/Q I I GND 10 11 I/OE Copyright (c) 1999 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com February 1999 16v8mil_03 1 Specifications GAL16V8D-7/10/883 Absolute Maximum Ratings(1) Supply voltage VCC ...................................... -0.5 to +7V Input voltage applied .......................... -2.5 to VCC +1.0V Off-state output voltage applied ......... -2.5 to VCC +1.0V Storage Temperature ................................ -65 to 150C Case Temperature with Power Applied ........................................ -55 to 125C 1.Stresses above those listed under the "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Recommended Operating Conditions Case Temperature (TC) .............................. -55 to 125C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage Low Level Output Current High Level Output Current Output Short Circuit Current Operating Power Supply Current CONDITION MIN. Vss - 0.5 TYP.3 -- -- -- -- -- -- -- -- -- 75 MAX. 0.8 Vcc+1 UNITS V V A A V V mA mA mA mA VIL VIH IIL1 IIH VOL VOH IOL IOH IOS2 ICC 2.0 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = VIL or VIH -- -- -- 2.4 -- -- VCC = 5V VOUT = 0.5V TA= 25C L-7/-10 -30 -- -100 10 0.5 -- 12 -2 -150 130 VIL = 0.5V VIH = 3.0V ftoggle = 15MHz Outputs Open 1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 C 2 Specifications GAL16V8D-7/10/883 AC Switching Characteristics Over Recommended Operating Conditions PARAMETER TEST COND1. A A -- -- -- A DESCRIPTION Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled 1 1 -- 7 0 76.9 -7 MIN. MAX. 7.5 6 6 -- -- -- -10 MIN. MAX. 2 1 -- 10 0 58.8 10 7 7 -- -- -- UNITS ns ns ns ns ns MHz tpd tco tcf2 tsu th fmax3 A A 76.9 100 -- -- 58.8 62.5 -- -- MHz MHz twh twl ten tdis -- -- B B C C 5 5 1 1 1 1 -- -- 9 7 9 7 8 8 -- -- -- -- -- -- 10 10 10 10 ns ns ns ns ns ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (TA = 25C, f = 1.0 MHz) SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 10 10 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested. 3 Specifications GAL16V8D/883 Absolute Maximum Ratings(1) Supply voltage VCC ...................................... -0.5 to +7V Input voltage applied .......................... -2.5 to VCC +1.0V Off-state output voltage applied ......... -2.5 to VCC +1.0V Storage Temperature ................................ -65 to 150C Case Temperature with Power Applied ........................................ -55 to 125C 1.Stresses above those listed under the "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Recommended Operating Conditions Case Temperature (TC) .............................. -55 to 125C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage Low Level Output Current High Level Output Current Output Short Circuit Current Operating Power Supply Current VCC = 5V VOUT = 0.5V TA= 25C L -15/ -20/-30 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = VIL or VIH CONDITION MIN. Vss - 0.5 TYP.2 -- -- -- -- -- -- -- -- -- 75 MAX. 0.8 Vcc+1 UNITS V V A A V V mA mA mA mA VIL VIH IIL IIH VOL VOH IOL IOH IOS1 ICC 2.0 -- -- -- 2.4 -- -- -30 -- -10 10 0.5 -- 12 -2 -150 130 VIL = 0.5V VIH = 3.0V ftoggle = 15MHz Outputs Open 1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 C 4 Specifications GAL16V8D/883 AC Switching Characteristics Over Recommended Operating Conditions TEST DESCRIPTION COND1. A A -- -- -- A Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled -15 -20 -30 UNITS ns ns ns ns ns MHz PARAMETER MIN. MAX. MIN. MAX. MIN. MAX. 3 2 -- 12 0 41.6 15 12 12 -- -- -- 3 2 -- 15 0 33.3 20 15 15 -- -- -- 3 2 -- 25 0 22.2 30 20 20 -- -- -- tpd tco tcf2 tsu th fmax3 A A 41.6 50 -- -- 33.3 41.6 -- -- 22.2 33.3 -- -- MHz MHz twh twl ten tdis -- -- B B C C 10 10 -- -- -- -- -- -- 15 15 15 15 12 12 -- -- -- -- -- -- 20 18 20 18 15 15 -- -- -- -- -- -- 30 25 30 25 ns ns ns ns ns ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (TA = 25C, f = 1.0 MHz) SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 10 10 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested. 5 Specifications GAL16V8/883 Switching Waveforms INPUT or I/O FEEDBACK VALID INPUT tsu INPUT or I/O FEEDBACK th CLK VALID INPUT tco REGISTERED OUTPUT 1/fmax (external fdbk) tpd COMBINATIONAL OUTPUT Combinatorial Output Registered Output INPUT or I/O FEEDBACK OE tdis COMBINATIONAL OUTPUT ten REGISTERED OUTPUT tdis ten Input or I/O to Output Enable/Disable OE to Output Enable/Disable twh CLK 1/fmax (w/o fb) twl CLK 1/fmax (internal fdbk) tcf REGISTERED FEEDBACK tsu Clock Width fmax with Feedback 6 Specifications GAL16V8/883 fmax Descriptions CLK LOGIC ARRAY REGISTER CLK tsu tco LOGIC ARRAY REGISTER fmax with External Feedback 1/(tsu+tco) Note: fmax with external feedback is calculated from measured tsu and tco. CLK tcf tpd fmax with Internal Feedback 1/(tsu+tcf) LOGIC ARRAY REGISTER tsu + th fmax with No Feedback Note: fmax with no feedback may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%. Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd. Switching Test Conditions Input Pulse Levels Input Rise and Fall Times Input Timing Reference Levels Output Timing Reference Levels Output Load GND to 3.0V 3ns 10% - 90% 1.5V 1.5V See Figure FROM OUTPUT (O/Q) UNDER TEST TEST POINT +5V R1 3-state levels are measured 0.5V from steady-state active level. Output Load Conditions (see figure) Test Condition A B C Active High Active Low Active High Active Low R1 390 390 390 R2 750 750 750 750 750 CL 50pF 50pF 50pF 5pF 5pF R2 C L* *C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE 7 Specifications GAL16V8/883 GAL16V8 Ordering Information (MIL-STD-883 and SMD) Ordering # Tpd (ns) 7.5 Tsu (ns) 7 Tco (ns) 6 Icc (mA) 13 0 130 Package 20-Pin CERDIP 20-Pin LCC 20-Pin CERDIP 20-Pin LCC 20-Pin CERDIP 20-Pin LCC 20-Pin CERDIP 20-Pin LCC 20-Pin CERDIP MIL-STD-883 GAL16V8D-7LD/883 GAL16V8D-7LR/883 GAL16V8D-10LD/883 GAL16V8D-10LR/883 GAL16V8D-15LD/883 GAL16V8D-15LR/883 GAL16V8D-20LD/883 GAL16V8D-20LR/883 GAL16V8D-30LD/883 SMD # 5962-8983907RA 5962-89839072A 5962-8983904RA 5962-89839042A 5962-8983903RA 5962-89839032A 5962-8983902RA 5962-89839022A 5962-8983901RA 10 10 7 13 0 130 15 12 12 130 130 20 15 15 130 130 30 25 20 130 Note: Lattice Semiconductor recognizes the trend in military device procurement towards using SMD compliant devices, as such, ordering by this number is recommended. Part Number Description XXXXXXXX _ XX X XX GAL16V8D Device Name MIL Process /883 = 883 Process Speed (ns) L = Low Power Power Package D = CERDIP R = LCC 8 |
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